Magnetometry and transport data complement polarized neutron reflectometry in magnetic depth profiling
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چکیده
منابع مشابه
Magnetometry and transport data complement polarized neutron reflectometry in magnetic depth profiling
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Determination of the magnetic field penetration depth in YBa2Cu307-d superconducting films by polarized neutron reflectometry
Polarized neutron reflectometry was used for the direct measurement of the magnetic-field penetration depth in a high-temperature (HT,) superconducting film. Two scattering geometries were used. The deduced neutron scattering length density profile gave an exact picture of the composition of the film. The fit to the spin-asymmetry yielded a magnetic-penetration depth of 1400 2 100 A at a temper...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2011
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.3662153